CFP: ICST'14
Call for Papers Seventh IEEE International Conference on Software Testing, Verification, and Validation (ICST’14) Cleveland, Ohio, U.S.A., March 31 - April 4, 2014 Submission of abstracts: September 23, 2013 Paper submission: September 30, 2013
in Conferences by mvelev on July 26, 2013

The IEEE International Conference on Software Testing, Verification, and Validation (ICST) is the premier conference for research in all areas related to software testing. The ever-increasing complexity, ubiquity, and dynamism of modern software systems is making software quality assurance activities, and in particular software testing more challenging. ICST provides an ideal forum where academics, industrial researchers, and practitioners can present their latest approaches for ensuring the quality of today’s complex software systems, exchange and discuss ideas, and compare experiences. In this spirit, ICST welcomes both research papers that present high quality original work and industry reports from practitioners that present real world experiences from which others can benefit.

 

Topics of interest include, but are not limited to:

Testing theory and practice

Testing in globally-distributed organizations

Model-based testing

Domain specific testing, such as:

     = Web-service testing

     = Database testing

     = Embedded software testing

Testing concurrent software

Testing large-scale distribute systems

Testing in multi-core environments

Validation testing

Security testing

Quality assurance

Model checking

Testing metrics

Fuzzing

Inspections

Testing tools

Design for testability

Testing education

Technology transfer in testing

Unit test-driven development

Acceptance test-driven development and behavior driven development

Testing of open source and third-party software

Software reliability

Performance and QoS testing

Standards

Formal verification

Empirical studies of testing techniques

Experience reports

Each submission will be reviewed by at least three members of the ICST Program Committee. Authors of the best research papers presented at ICST 2013 will be invited to extend their work for possible inclusion in a special issue of Software Testing, Verification, and Reliability, a Wiley journal.

 

Format

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Research Track:

We invite submission of research and technical papers that describe original and significant work in the research and practice of software testing, verification and validation. Case studies and empirical research are welcome. Papers must neither have been previously accepted for publication nor submitted in another conference or journal. The ICST 2013 research track accepts only full research papers. Short papers are not accepted to the research track.  Research papers must conform to the two-column IEEE conference publication format (http://www.computer.org/portal/web/cscps/formatting), must be submitted in PDF format and must not exceed 10 pages (incl. references and appendix).

 

Industry Track:

There are two paper formats: full length (ten pages) and short (four pages). Full length papers should present significant achievements and advances in industrial software testing, verification, or validation. Papers with metrics that quantify effects on time, cost, and quality are preferred. Short papers should concentrate on experience reports or discuss open problems or challenges. The program committee will review all submission. Accepted and presented contributions will be part of the published conference proceedings. The evaluation criteria for industry papers are based less on the originality of the technical contribution, and more on its relevance for practice soundness of the presented results, and implications for research. Practitioners can alternatively submit to the Industrial Presentations track that does not require a paper. Industry papers must conform to the two-column IEEE conference publication format (http://www.computer.org/portal/web/cscps/formatting), must be submitted in pdf format and must not exceed 10 or 4 pages, respectively to full-length papers or short papers (incl. references and appendix).

 

How to submit?

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Submissions will be handled via EasyChair at http://www.easychair.org/conferences/?conf=icst2014.

 

Important Dates

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Submission of abstracts:  September 23, 2013

Paper submission:  September 30, 2013

Notification of acceptance:  December 22, 2013

Camera ready paper:  TBA

Conference date:  March 31 - April 4, 2014

 

Program Committee

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Program Committee Chairs:

Laurie Williams, North Carolina State University, USA

Claes Wohlin, Blekinge Institute of Technology, Sweden

 

Committee Members:

Paul Ammann, George Mason University, USA

Anneliese Andrews, University of Denver, USA

Giuliano Antoniol, Ecole Polytechnique de Montréal, Canada

Thomas Ball, Microsoft Research, USA

Fevzi Belli, University of Paderborn, Germany

Tomas Berling, Saab AB, EDS, Sweden

Kirill Bogdanov, University of Sheffield, UK

Fabrice Bouquet, Université de Franche Comté, France

Tevfik Bultan, University of California at Santa Barbara, USA

Cristian Cadar, Imperial College London, UK

Ana Cavalli, Institut National des Telecommunications, France

James Clause, University of Delaware, USA

Ian Craggs, IBM United Kingdom, UK

Christoph Csallner, University of Texas at Arlington, USA

Marcio Eduardo Delamaro, Universidade de São Paulo, Brazil

Massimiliano Di Penta, University of Sannio, Italy

Rachida Dssouli, Concordia University, Canada

Lydie Du Bousquet, Laboratoire d'Informatique de Grenoble (LIG), France

Stephen Edwards, Virginia Tech, USA

Sigrid Eldh, Ericsson and Karlstad University, Sweden

Robert Feldt, Blekinge Institute of Technology, Sweden

Franck Fleurey, SINTEF, Norway

Gordon Fraser, University of Sheffield, UK

Sudipto Ghosh, Colorado State University, USA

Arnaud Gotlieb, Simula Research Laboratory, Norway

Jens Grabowski, Gottingen University, Germany

Mark Harman, University College London, UK

Robert Hierons, Brunel University, UK

Florentin Ipate, University of Bucharest, Romania

Natalia Juristo, Universidad Politécnica de Madrid, Spain

Gail Kaiser, Columbia University, USA

Aditya Kanade, Indian Institute of Science, India

Johannes Kinder, École Polytechnique Fédérale de Lausanne (EPFL), Switzerland

Yu Lei, University of Texas at Arlington, USA

Francesca Lonetti, ISTI CNR, Italy

Eda Marchetti, ISTI-CNR, Italy

Leonardo Mariani, University of Milan-Bicocca, Italy

Darko Marinov, University of Illinois at Urbana-Champaign, USA

Wes Masri, American University of Beirut, Lebanon

Phil McMinn, University of Sheffield, UK

Atif Memon, University of Maryland, USA

James Miller, University of Alberta, Canada

Tejeddine Mouelhi, University of Luxembourg, Luxembourg

Henry Muccini, University of L'Aquila, Italy

Jürgen Münch, University of Helsinki, Finland

Nachiappan Nagappan, Microsoft Corporation, USA

Brian Nielsen, Aalborg University, Denmark

Jeff Offutt, George Mason University, USA

Marcel Oliveira, Universidade Federal do Rio Grande do Norte, Brazil

Thomas Ostrand, Rutgers University Center for Discrete Mathematics & Computer Science, USA

Alexander Pretschner, Technische Universitaet Muenchen, Germany

Marc Roper, University of Strathclyde, UK

Gregg Rothermel, University of Nebraska - Lincoln, USA

Abhik Roychoudhury, National University of Singapore, Singapore

Per Runeson, Lund University, Sweden

Saurabh Sinha, IBM Research, India

Paul Strooper, University of Queensland, Australia

Lin Tan, University of Waterloo, Canada

Tatsuhiro Tsuchiya, Osaka University, Japan

Richard Torkar, Chalmers and the University of Gothenburg, Sweden

Jan Tretmans, TNO - Embedded Systems Innovation, The Netherlands

T.H. Tse, University of Hong Kong, Hong Kong

Hasan Ural, University of Ottawa, Canada

Arie van Deursen, Delft University of Technology, The Netherlands

Miroslav Velev, Aries Design Automation, USA

Helene Waeselynck, LAAS-CNRS, France

Hironori Washizaki, Waseda University, Japan

Michael Whalen, University of Minnesota, USA

Franz Wotawa, Graz University of Technology, Austria

Tao Xie, University of Illinois, USA

Xiangyu Zhang, Purdue University, USA

Hong Zhu, Oxford Brookes University, UK

Peter Zimmerer, Siemens AG, Germany

Thomas Zimmerman, Microsoft Research, USA